
Tungsten probes used for LED (Light Emitting Diode) wafer testing are specialized probes designed for making electrical contact with LED devices during the testing and inspection processes. LED wafer testing involves assessing the electrical characteristics, ffality, and quality of individual LED components on a semiconductor wafer before they are packaged into final LED devices. They play a crucial role in facilitating these tests. Material Composition: Tungsten: Tungsten is often chosen for probe tips due to its hardness, durability, and resistance…