Tungsten probe is a precision testing tool made from high-purity tungsten, widely used for inspecting tiny components and electrical performance testing in the electronics, electrical, and semiconductor industries. Tungsten’s extremely high melting point, excellent conductivity, and wear resistance enable the tungsten probe to maintain stable performance and precise measurement even in high-temperature and harsh environments. The probe tip features high hardness and corrosion resistance, effectively reducing contact resistance and signal interference to ensure accurate test data. Its shape and size can be customized to meet various testing requirements and is commonly applied in integrated circuit (IC) testing, wafer probe cards, and microelectronics assembly.
